Digital Microcircuit Testing
Component Packaging
Taping and Reeling
Prom Programming
Processing
Environmental Conditioning
Solderability / Tinning
PLD Programming
Final Inspection
Hardware / Assembly and Fabrication
Reliability Testing
R/F Microwave
Discrete Testing
Materials Analysis
Relays & Cables
RF Microwave
Environmental Testing
Prom Programming

 

Digital Microcircuit Testing Capabilities

Digital Testing  - p16

SSI/MSI/LSI/VLSI/VHLSI

DC/AC SYMBOL PARAMETERS REMARKS
D
C

C
H
A
R
A
C
T
E
R
I
S
T
I
C
S

 

VOH High level output voltage
VOL Low level output voltage
IIH High level input current
IIL Low level input current
IOH High level output current Measure in conjunction with VOH
IOL Low level output current Measure in conjunction wth VOL
IOS Output short circuit current
ICEX Output leakage current
– – Noise margins Where noise margin is regarded as critical to the application
ICCL Low level supply current drain
ICCH High level supply current drain
VB Breakdown voltage Where applicable
Where node terminals exist:
IINH a.  High level node current At specified VINH
IINL b.  Low level node current At specified VINH
VIH Input voltage high
VIL Input voltage low
VIK Input voltage clamp
AC – – Dynamic Where applicable and/or when specifically requested and quoted accordingly
FUNCTIONAL OUTPUT EXERCISE PERFORMANCE
NOTE:  MEMORY & LSI DEVICES – CONTACT NJMET ENGINEERING DEPARTMENT FOR TEST DETAILS